About the Society
The IEEE Reliability Society covers all aspects of research, development, and implementation of cutting-edge techniques to improve the life of systems and products.
Lead Associate Editor(s)
Zhaojun (Steven) Li, Western New England University, USA
Liudong Xing, University of Massachusetts – Dartmouth, USA
Associate Editors
• Catherine Fang, Carnegie Mellon University, USA
• Janet Lin, Lulea University of Technology, Sweden
• Yun Lin, Harbin Engineering University, China
• Yu Liu, University of Electronic Science and Technology of China, China
• Haidong Shao, Hunan University, China