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Learn More About IEEE Access

Multidisciplinary Open Access Journal

IEEE Access is an award-winning, multidisciplinary, all-electronic archival journal, continuously presenting the results of original research or development across all of IEEE’s fields of interest. Supported by author publication fees, its hallmarks are a rapid peer review and publication process with open access to all readers.

A scope covering all IEEE fields of interest.

IEEE Access publishes articles that are of high interest to readers: original, technically correct, and clearly presented. The scope of this journal comprises all of IEEE's fields of interest, emphasizing applications-oriented and interdisciplinary articles. IEEE Access also accepts traditional technical articles, as well as reviews and surveys.

Bibliometrics

IEEE Access has an impact factor of 1.270, an Eigenfactor of 0.00198, and an article influence score of 0.706 (per 2016 JCR).

The Journal has been accepted into The Web of Science, which includes:

CA3
  • The Clarivate Analytics Science Citation Index Expanded
  • Journal Citation Reports/Science Edition
  • Current Contents/Engineering, Computing and Technology Edition

Indexing

IEEE Access is indexed by IET Inspec, Ei Compendex, Scopus, EBSCOhost, and Google Scholar. It is also listed in the Directory of Open Access Journals (DOAJ).
IET Inspec logo Ei Compendex logo Scopus logo EBSCOhost logo Google Scholar logo



Among most popular downloads on IEEE Xplore®

IEEE Access articles are in IEEE Xplore’s top 10 Most Popular downloads every month. Due to this popularity, and a commitment to upholding high IEEE peer review quality standards, one of its articles has been awarded the 2015 IEEE Donald G. Fink Prize Paper award.

No page limits

Simple Article Processing Charge of $1,750 per article without over-length page charges. IEEE members will receive a 5% discount, and members of IEEE Societies will receive a 15% discount. See details for hardship discounts in our frequently asked questions.

View Frequently Asked Questions

View IEEE Access articles on IEEE Xplore